Gaya APA
Losurdo, M., Hingerl, K.
(2013).
Ellipsometry at the Nanoscale
.
Springer Berlin Heidelberg:
Springer.
Gaya MLA
Losurdo, Maria., Hingerl, Kurt.
"Ellipsometry at the Nanoscale".
Springer Berlin Heidelberg:
Springer,
2013.
E-Book.